郑舜生 杨大荣
Zheng Shunsheng Yang Darong Department of Electrical Engineering
In this paper,the telation between sensitivity and defect is discussed for detecting plane defects using the X-ray photograph. We propose the concept of the critical width.The critical width for the middle and thin plates is O.O1mm.
郑舜生 杨大荣. X射线照相对平面缺陷检测能力的研究[J].湖南大学学报：自然科学版,1992,19(4):
