（1.School of Physics and Microelectronics Science，Hunan University，Changsha 410000，China； 2. Institute of Microelectronics，Chinese Academy of Sciences，Beijing 100029，China） 在知网中查找 在百度中查找 在本站中查找
This paper proposed an improved March CS algorithm to complete the built-in self-test of SRAM memory due to the problem of March C + algorithm's fault coverage. The static and dynamic fault of memory cell were sensitized by the original algorithm increasing the read-write operation of the algorithm element， so that the fault coverage was enhanced. Finally， the March CS algorithm achievesd 91.67% and 76.93% coverage of static and dynamic faults respectively through the simulation experiments of the 1 024*32-size fault static Randon-Access memory and the measurement of FPGA to SRAM chips.
