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A Fast and Hierarchical Early Z-Test for 3D Graphics Processors
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    Abstract:

    A Fast and Hierarchical Early Z-Test (FH-EZT) was proposed to reject the pixels unnecessary to draw as soon as possible from the tile level and pixel level by combining Z_max and Z_min algorithm. Redundant pre-pixel operations including Z reads/writes, color reads/writes and texture reads were avoided efficiently to decrease the rendering times. Shared tile cache (TileZcache) with high hit rate cuts down the testing cycles and the values of tiles can update dynamically utilizing less cost. Experiments show that the proposed algorithm can reduce 12.5% up to 25.6% rendering cycles for each random tested frame and enhance 4% up to 43.8% for the ratio of bandwidth reduction and storage area per pixel, which is suitable for embedded 3D engine.

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