FDR codes can compress test stimuli data effectively. However, the number of faults detected by a test pattern is small in average, since don't care bits in the test set are filled by all 0s. The test quality is low. In order to improve the test quality and further increase the test compression ratio, this paper, based on FDR codes, proposed a scheme in which the test response of the previous test pattern is utilized to fill the don't care bits in the current test pattern. This scheme increases the randomness of the X-filling. Therefore, the test quality is improved. In this scheme, the test compression ratio is also related to the order of test patterns. This paper also proposed a test pattern reordering approach based on the nearest neighbor algorithm to decrease the number of conflict bits between the test response of the previous test pattern and the current test pattern. Difference vectors can be obtained by the difference between test patterns and the test responses of their previous test patterns. The test data volume can be reduced by using FDR codes for the difference vectors. Experiment results show that, for larger ISCAS'89 circuits, the proposed approach increases the test quality by 5.9% and test compression ratio by 2.5% in average, compared with those of FDR codes. The hardware overhead, which is only an XOR gate, can be omitted.