LI Mengchuan1,MENG Zhiqiang1?覮,HU Yi1,WANG Jun1,HE Yunze1,2, ZOU Xiang1,JIAO Wenhao1,OUYANG Honglin1
(1. College of Electrical and Information Engineering,Hunan University,Changsha 410082,China; (2. Fujian Province University Key Laboratory of Nondestructive Testing,Fuqing Branch of Fujian Normal University,Fuqing 350300,China)