CHI Yuanxiao1,2,WANG Zhijun3†,LIANG Liping3,LIU Fengman1,QIU Xin1
(1.Institute of Microelectronics of Chinese Academy of Science, Beijing 100029, China; 2.School of Integrated Circuits, University of Chinese Academy of Science, Beijing 100190, China; 3.School of Integrated Circuits, Beijing University of Posts and Telecommunications, Beijing 100876, China)